CEOS EO HANDBOOK – INSTRUMENT SUMMARY
- XPS
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Full Name
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XUV Photometer System
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Status
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No longer operational
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Instrument Agencies
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NASA
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Maturity
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Instrument Type
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Other
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Geometry
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Instrument Technology
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Solar irradiance monitor
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Sampling
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Imaging
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Data Access
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Open Access
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Data Format
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CDF
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Measurements and Applications
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Measure the extreme UV solar irradiance from 1 - 35 nm with absolute accuracy of 20% and relative stability of 1% per year.
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Resolution Summary
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Swath Summary
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Accuracy Summary
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20% (0.2)
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Waveband Summary
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UV: 1 - 35 nm
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Instrument Measurements
Measurements Overview
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Instrument Missions
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