MBEI Instrument

Measurements and Applications

Multispectral scanner images of land surface.

Instrument Summary

Full Name
Multi-Band Earth Imager
Status
Operational
Instrument Agencies
Maturity
Instrument Type
High resolution optical imagers
Geometry
Nadir-viewing
Instrument Technology
High resolution optical imager
Sampling
Imaging
Data Access
Open Access
Data Format

Performance Summary

Resolution
8.2 m
[Best Resolution: 8.2m]
Swath
46.6 km pointable ±35° from nadir
[Max Swath: 46 km]
Accuracy
8 bits
Waveband
VIS - NIR: 0.51 - 0.90 µm; VIS: 0.51 - 0.59 µm, 0.61 - 0.68 µm; NIR: 0.80 - 0.89 µm
VIS (~0.40 µm - ~0.75 µm)
NIR (~0.75 µm - ~1.3 µm)

Instrument Missions

Sich-2 - Sich-2 (2011 - 2012)
Sich 2-30 - Sich 2-30 (2022 - 2027)

Instrument Measurements