CEOS EO HANDBOOK – INSTRUMENT SUMMARY
- SEM/XRS-EUV
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Full Name
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X-Ray Sensor - Extreme Ultra-Violet Sensor
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Status
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No longer operational
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Instrument Agencies
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NOAA
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Maturity
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Instrument Type
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Space environment
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Geometry
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Instrument Technology
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Space environment monitor
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Sampling
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Data Access
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Data Format
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Measurements and Applications
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To measure disk-integrated solar X-ray and EUV fluxes. Assemblage of two channels in the X-ray ranges 0.05-0.3 nm and 0.1-0.8 nm; and five channels in the EUV ranges around 10 nm, 30 nm, 60 nm, 80 nm and 126 nm [including Fe-XV at 28.4 nm, He-II at 30.4 nm and H-Lyman-alpha at 121.6 nm]
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Resolution Summary
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Swath Summary
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Accuracy Summary
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Waveband Summary
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Instrument Measurements
Measurements Overview
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Instrument Missions
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