CEOS EO HANDBOOK – INSTRUMENT SUMMARY - PAN MUX -
Full Name Panchromatic and multispectral imager Status No longer considered
Instrument Agencies CAST Maturity
Instrument Type High resolution optical imagers Geometry
Instrument Technology High resolution optical imager Sampling Imaging
Data Access Data Format
Measurements and Applications Measurements of cloud type and extent and land surface reflectance, and used for global land surface applications.
Resolution Summary 5 m panchromatic and 10 m multispectral
Swath Summary 60 km
Accuracy Summary
Waveband Summary VIS: 0.52 - 0.59 µm, 0.63 - 0.69 µm; NIR: 0.77 - 0.89 µm; PAN: 0.51 - 0.85 µm
VIS (~0.40 µm - ~0.75 µm)
NIR (~0.75 µm - ~1.3 µm)
Instrument Measurements
Measurements Overview
CategoryParameter
Albedo and reflectanceEarth surface albedo
Cloud type, amount and cloud top temperatureCloud type
Multi-purpose imagery (land)Land surface imagery
Radiation budgetShort-wave Earth surface bi-directional reflectance
VegetationVegetation type
Thematic Links Global Climate Observing System Essential Climate Variables (GCOS ECVs)
ECVDescriptionProduct(s)ECV Inventory 3.0 Record(s)
Albedo click here click here search ECV Inventory records
Instrument Missions