THE CEOS DATABASE : Missions, Instruments and Measurements
CEOS EO HANDBOOK – INSTRUMENT SUMMARY - XPS -
Full Name XUV Photometer System Status Operational
Instrument Agencies NASA Maturity
Instrument Type Other Geometry
Instrument Technology Solar irradiance monitor Sampling Imaging
Data Access Open Access Data Format CDF
Measurements and Applications Measure the extreme UV solar irradiance from 1 - 35 nm with absolute accuracy of 20% and relative stability of 1% per year.
Resolution Summary
Swath Summary
Accuracy Summary 20% (0.2)
Waveband Summary UV: 1 - 35 nm
TBD
UV (~0.01 µm - ~0.40 µm)
Instrument Measurements
CategoryParameterAccuracy
Radiation budgetDownwelling (Incoming) solar radiation at TOA 
Instrument Missions
SORCE - Solar Radiation and Climate Experiment (2003 - 2019)
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